SEM based mineralogical characterization of primary and secondary ores
A latest-generation electron microscope (Zeiss Sigma 300) equipped with 2 EDX Bucker detectors provides liberation and mineral mass balance analysis using the mineralogical software.
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| Zeiss Sigma 300 FEG | Mineral mapping |
– Mineral Mass balance
– Liberation
– Impact of mineralogical features (size, textures, mineralogy) on process efficiency
– 2 Brucker EDX detector
– micro-focused X-ray source
– Mineralogic mining software
Contact : hassan.bouzahzah@ULiege